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남인혁

Nam, Inhyuk
Extreme Lasers and Exotic Plasmas Lab
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dc.citation.endPage 1047 -
dc.citation.startPage 1038 -
dc.citation.title JOURNAL OF SYNCHROTRON RADIATION -
dc.citation.volume 30 -
dc.contributor.author Choi, Tae-Kyu -
dc.contributor.author Park, Jaeku -
dc.contributor.author Kim, Gyujin -
dc.contributor.author Jang, Hoyoung -
dc.contributor.author Park, Sang-Youn -
dc.contributor.author Sohn, Jang Hyeob -
dc.contributor.author Cho, Byoung Ick -
dc.contributor.author Kim, Hyunjung -
dc.contributor.author Kim, Kyung Sook -
dc.contributor.author Nam, Inhyuk -
dc.contributor.author Chun, Sae Hwan -
dc.date.accessioned 2025-04-25T15:10:56Z -
dc.date.available 2025-04-25T15:10:56Z -
dc.date.created 2025-04-07 -
dc.date.issued 2023-11 -
dc.description.abstract Self-seeded hard X-ray pulses at PAL-XFEL were used to commission a resonant X-ray emission spectroscopy experiment with a von Hamos spectrometer. The self-seeded beam, generated through forward Bragg diffraction of the [202] peak in a 100 mu m-thick diamond crystal, exhibited an average bandwidth of 0.54 eV at 11.223 keV. A coordinated scanning scheme of electron bunch energy, diamond crystal angle and silicon monochromator allowed us to map the Ir L beta 2 X-ray emission lines of IrO2 powder across the Ir L 3-absorption edge, from 11.212 to 11.242 keV with an energy step of 0.3 eV. This work provides a reference for hard X-ray emission spectroscopy experiments utilizing self-seeded pulses with a narrow bandwidth, eventually applicable for pump-probe studies in solid-state and diluted systems. -
dc.identifier.bibliographicCitation JOURNAL OF SYNCHROTRON RADIATION, v.30, pp.1038 - 1047 -
dc.identifier.doi 10.1107/S1600577523007312 -
dc.identifier.issn 0909-0495 -
dc.identifier.scopusid 2-s2.0-85176496006 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/86774 -
dc.identifier.wosid 001085465500001 -
dc.language 영어 -
dc.publisher INT UNION CRYSTALLOGRAPHY -
dc.title Resonant X-ray emission spectroscopy using self-seeded hard X-ray pulses at PAL-XFEL -
dc.type Article -
dc.description.isOpenAccess TRUE -
dc.relation.journalWebOfScienceCategory Instruments & Instrumentation; Optics; Physics, Applied -
dc.relation.journalResearchArea Instruments & Instrumentation; Optics; Physics -
dc.type.docType Article -
dc.description.journalRegisteredClass scie -
dc.description.journalRegisteredClass scopus -
dc.subject.keywordAuthor X-ray free-electron laser (XFEL) -
dc.subject.keywordAuthor self-seeding -
dc.subject.keywordAuthor resonant X-ray emission spectroscopy (RXES) -
dc.subject.keywordAuthor von Hamos spectrometer -
dc.subject.keywordPlus SYNCHROTRON-RADIATION -
dc.subject.keywordPlus FREE-ELECTRON LASER -
dc.subject.keywordPlus SPECTROMETER -
dc.subject.keywordPlus SCATTERING -
dc.subject.keywordPlus EDGE -
dc.subject.keywordPlus FLUORESCENCE -
dc.subject.keywordPlus BEAMLINE -
dc.subject.keywordPlus SPECTRA -
dc.subject.keywordPlus DESIGN -

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