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dc.citation.endPage 6581 -
dc.citation.number 4 -
dc.citation.startPage 6572 -
dc.citation.title IEEE SENSORS JOURNAL -
dc.citation.volume 25 -
dc.contributor.author Kim, Jongbeom -
dc.contributor.author Woo, Doohyung -
dc.date.accessioned 2025-04-25T15:09:51Z -
dc.date.available 2025-04-25T15:09:51Z -
dc.date.created 2025-03-05 -
dc.date.issued 2025-02 -
dc.description.abstract A digital readout integrated circuit (DROIC) incorporating a pixel-level sequential time-to-digital converter (TDC) is studied for microbolometer infrared focal plane arrays (IRFPAs). To improve signal-to-noise ratios (SNRs) with sufficient integration time for IRFPAs with large arrays and small pixel sizes, a sequential driving method with high precision bias suppression is used. A pixel-level TDC with a single-slope analog-to-digital converter (SS-ADC) is proposed to improve dynamic range (DR) and SNR over a wide input range despite low supply voltage and power consumption. The readout circuit is fabricated using a 0.18 mu m standard CMOS process for 1026 x 768 arrays with a pixel size of 15 x 15 mu m. The maximum integration time and DR are 1.95 ms and 80.9 dB, respectively, with a power consumption of 0.21 mu W per pixel. -
dc.identifier.bibliographicCitation IEEE SENSORS JOURNAL, v.25, no.4, pp.6572 - 6581 -
dc.identifier.doi 10.1109/JSEN.2024.3523498 -
dc.identifier.issn 1530-437X -
dc.identifier.scopusid 2-s2.0-85214789527 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/86746 -
dc.identifier.wosid 001422055600016 -
dc.language 영어 -
dc.publisher IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC -
dc.title Pixel-Level Sequential TDC With Wide Dynamic Range for Large-Array Microbolometer IRFPAs -
dc.type Article -
dc.description.isOpenAccess FALSE -
dc.relation.journalWebOfScienceCategory Engineering, Electrical & Electronic; Instruments & Instrumentation; Physics, Applied -
dc.relation.journalResearchArea Engineering; Instruments & Instrumentation; Physics -
dc.type.docType Article -
dc.description.journalRegisteredClass scie -
dc.description.journalRegisteredClass scopus -
dc.subject.keywordAuthor Signal to noise ratio -
dc.subject.keywordAuthor Noise -
dc.subject.keywordAuthor Bolometers -
dc.subject.keywordAuthor Timing -
dc.subject.keywordAuthor Capacitors -
dc.subject.keywordAuthor Cameras -
dc.subject.keywordAuthor Sensors -
dc.subject.keywordAuthor Voltage -
dc.subject.keywordAuthor Digital readout integrated circuit (DROIC) -
dc.subject.keywordAuthor microbolometer -
dc.subject.keywordAuthor pixel-level time-to-digital converter (TDC) -
dc.subject.keywordAuthor uncooled infrared imager -
dc.subject.keywordAuthor wide dynamic range (DR) -
dc.subject.keywordAuthor Analog-digital conversion -
dc.subject.keywordAuthor Power demand -

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