Investigating liquid crystal alignment characteristics of gallium oxide layers under different annealing temperatures

Abstract

In this study, we investigated the effect of annealing temperature on the liquid crystal (LC) alignment characteristics of gallium oxide (Ga₂O₃) alignment films using the sol-gel method. The gallium oxide (Ga₂O₃) used in the test is a material that can improve the electrical and optical performance of liquid crystal displays (LCDs) and was used in the experiment as a substitute for the existing polyimide for the LC alignment film. In the experiment, gallium oxide (Ga₂O₃) alignment films were prepared on ITO glass substrates and the effects on the LC cell characteristics were confirmed and analyzed by firing them at annealing temperatures (100°C, 150°C, and 200°C). The effects of temperature were analyzed by measuring the polarizing optical microscope (POM), anchoring energy, contact angle, pretilt angle, residual DC, response time, and voltage-transmittance characteristics. As a result, we confirmed the liquid crystal alignment effect according to the firing conditions of the gallium oxide (Ga₂O₃) alignment film for improving the liquid crystal alignment process, and the gallium oxide (Ga₂O₃) alignment film showed uniform liquid crystal alignment with high transmittance in all liquid crystal cells regardless of the firing conditions. At a firing temperature of 200 degrees, it showed excellent thermal stability results, and at a firing temperature of 200 degrees or higher, a stable gallium oxide (Ga₂O₃) alignment film was created, and as a result, it was confirmed to have a stable fixed energy value with the liquid crystal molecules. It is expected that higher quality LCDs can be implemented through fine adjustments in the existing liquid crystal alignment process.