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- Kim, Sungil
- Data Analytics Lab.
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| DC Field | Value | Language |
|---|---|---|
| dc.citation.conferencePlace | IT | - |
| dc.citation.title | 2nd INFORMS Conference on Quality, Statistics and Reliability | - |
| dc.contributor.author | Kim, Sungil | - |
| dc.date.accessioned | 2025-01-13T09:35:09Z | - |
| dc.date.available | 2025-01-13T09:35:09Z | - |
| dc.date.created | 2025-01-12 | - |
| dc.date.issued | 2024-07-02 | - |
| dc.identifier.bibliographicCitation | 2nd INFORMS Conference on Quality, Statistics and Reliability | - |
| dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/86017 | - |
| dc.publisher | INFORMS | - |
| dc.title | Domain-Knowledge-Informed Functional Outlier Detection for Line Quality Control Systems | - |
| dc.type | Conference Paper | - |
| dc.date.conferenceDate | 2024-07-01 | - |
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