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- Kim, Kyung Rok
- Nano-Electronic Emerging Devices Lab.
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Non-Uniform Interface Trap Density by Halo Ion-Implantation Process for Flicker Noise Estimation
- Author(s)
- 송유빈, 안상효, 김민재, 류민우, Kim, Kyung Rok
- Issued Date
- 2024-01-25
- Citation
- 제31회 한국반도체학술대회
- Publisher
- POSTECH, KSIA, COSAR
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