File Download
There are no files associated with this item.
SFX Link
- Find it @ UNIST can give you direct access to the published full text of this article. (UNISTARs only)
- Jeong, Hu Young
- UCRF Electron Microscopy group
Views & Downloads
Detailed Information
Cited time in 
Cited time in 
Cited time in
Metadata Downloads
Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.citation.conferencePlace | KO | - |
| dc.citation.title | Nano Korea 2024 | - |
| dc.contributor.author | Jeong, Hu Young | - |
| dc.date.accessioned | 2025-01-02T16:05:06Z | - |
| dc.date.available | 2025-01-02T16:05:06Z | - |
| dc.date.created | 2025-01-02 | - |
| dc.date.issued | 2024-07-04 | - |
| dc.identifier.bibliographicCitation | Nano Korea 2024 | - |
| dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/85506 | - |
| dc.language | 영어 | - |
| dc.publisher | Korea Nanotechnology Research Society | - |
| dc.title | Interface Analysis of Nano-Scale Semiconductor Thin Films using Cross-sectional TEM | - |
| dc.type | Conference Paper | - |
| dc.date.conferenceDate | 2024-07-03 | - |
Items in Repository are protected by copyright, with all rights reserved, unless otherwise indicated.