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- Yoon, Tae-Sik
- Nano Semiconductor Research Lab.
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Thin Film Transistor with Oxygen-Deficient Tantalum Oxide Charge-Trap Layer and Indium-Gallium-Zinc Oxide Channel for Non-Volatile Charge-Trap Memory Application
- Author(s)
- Park, Jae-Gwan, Yoon, Tae-Sik
- Issued Date
- 2024-11-27
- Citation
- ENGE 2024
- Publisher
- 대한금속재료학회
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