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- Lee, Zonghoon
- Atomic-Scale Electron Microscopy Lab.
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| DC Field | Value | Language |
|---|---|---|
| dc.citation.conferencePlace | US | - |
| dc.citation.title | Microscopy&Microanalysis 2024 | - |
| dc.contributor.author | Kim, Jaemin | - |
| dc.contributor.author | Son, Seungwoo | - |
| dc.contributor.author | Choe, Myeonggi | - |
| dc.contributor.author | Lee, Zonghoon | - |
| dc.date.accessioned | 2024-12-19T15:35:08Z | - |
| dc.date.available | 2024-12-19T15:35:08Z | - |
| dc.date.created | 2024-12-18 | - |
| dc.date.issued | 2024-07-30 | - |
| dc.identifier.bibliographicCitation | Microscopy&Microanalysis 2024 | - |
| dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/85072 | - |
| dc.publisher | Microscopy Society of America | - |
| dc.title | In situ TEM investigation of gaphitization mechanism on nickel catalyst | - |
| dc.type | Conference Paper | - |
| dc.date.conferenceDate | 2024-07-28 | - |
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