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Gong, Taesik
Ubiquitous AI Lab
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dc.citation.conferencePlace US -
dc.citation.endPage 28652 -
dc.citation.startPage 28643 -
dc.citation.title IEEE Conference on Computer Vision and Pattern Recognition -
dc.contributor.author Lee, T. -
dc.contributor.author Chottananurak, S. -
dc.contributor.author Gong, Taesik -
dc.contributor.author Lee, S.-J. -
dc.date.accessioned 2024-11-08T16:35:06Z -
dc.date.available 2024-11-08T16:35:06Z -
dc.date.created 2024-11-08 -
dc.date.issued 2024-06-16 -
dc.description.abstract Test-time adaptation (TTA) has emerged as a viable solution to adapt pretrained models to domain shifts using unlabeled test data. However, TTA faces challenges of adaptation failures due to its reliance on blind adaptation to unknown test samples in dynamic scenarios. Traditional methods for out-of-distribution performance estimation are limited by unrealistic assumptions in the TTA context, such as requiring labeled data or retraining models. To address this issue, we propose AETTA, a label-free accuracy estimation algorithm for TTA. We propose the prediction disagreement as the accuracy estimate, calculated by comparing the target model prediction with dropout inferences. We then improve the prediction disagreement to extend the applicability of AETTA under adaptation failures. Our extensive evaluation with four baselines and six TTA methods demonstrates that AETTA shows an average of 19.8%p more accurate estimation compared with the baselines. We further demonstrate the effectiveness of accuracy estimation with a model recovery case study, showcasing the practicality of our model recovery based on accuracy estimation. The source code is available at https://github.com/taeckyung/AETTA. © 2024 IEEE. -
dc.identifier.bibliographicCitation IEEE Conference on Computer Vision and Pattern Recognition, pp.28643 - 28652 -
dc.identifier.doi 10.1109/CVPR52733.2024.02706 -
dc.identifier.issn 1063-6919 -
dc.identifier.scopusid 2-s2.0-85207252125 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/84395 -
dc.language 영어 -
dc.publisher IEEE Computer Society -
dc.title AETTA: Label-Free Accuracy Estimation for Test-Time Adaptation -
dc.type Conference Paper -
dc.date.conferenceDate 2024-06-16 -

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