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dc.citation.endPage 1146 -
dc.citation.number 5-8 -
dc.citation.startPage 1135 -
dc.citation.title INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY -
dc.citation.volume 66 -
dc.contributor.author Lee, Seungchul -
dc.contributor.author Ni, Jun -
dc.date.accessioned 2023-12-22T04:06:41Z -
dc.date.available 2023-12-22T04:06:41Z -
dc.date.created 2014-11-06 -
dc.date.issued 2013-05 -
dc.description.abstract Deteriorated equipment has a significant impact on the product quality and maintenance policies. In this paper, we present a decision-making architecture to determine maintenance and product dispatching policies based on condition-monitoring information and the relationship between machine degradation and associated product quality. We use a Markov decision process for the long-term decision making and integer programming for the short-term decision making with a multi-product, multi-station system. We demonstrate the advantage of the proposed approach by comparing the proposed policy with traditional decision-making approaches. Furthermore, we illustrate the improvement of the proposed policy over the current usage-based maintenance policy with a semiconductor manufacturing process application. -
dc.identifier.bibliographicCitation INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY, v.66, no.5-8, pp.1135 - 1146 -
dc.identifier.doi 10.1007/s00170-012-4395-6 -
dc.identifier.issn 0268-3768 -
dc.identifier.scopusid 2-s2.0-84880571777 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/8394 -
dc.identifier.url http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=84880571777 -
dc.identifier.wosid 000317970300044 -
dc.language 영어 -
dc.publisher SPRINGER LONDON LTD -
dc.title Joint decision making for maintenance and production scheduling of production systems -
dc.type Article -
dc.description.journalRegisteredClass scie -
dc.description.journalRegisteredClass scopus -
dc.subject.keywordAuthor Joint maintenance and product scheduling -
dc.subject.keywordAuthor Condition-based maintenance -
dc.subject.keywordAuthor Markov decision process -
dc.subject.keywordAuthor Semiconductor manufacturing -
dc.subject.keywordPlus LINE EQUIPMENT CONDITION -
dc.subject.keywordPlus YIELD INFORMATION -
dc.subject.keywordPlus MODEL -
dc.subject.keywordPlus DISTRIBUTIONS -

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