File Download

  • Find it @ UNIST can give you direct access to the published full text of this article. (UNISTARs only)
Related Researcher

노윤수

Rho, Yoonsoo
Photonics Research in Manufacturing and Advanced Diagnostics Lab.
Read More

Views & Downloads

Detailed Information

Cited time in webofscience Cited time in scopus
Metadata Downloads

Full metadata record

DC Field Value Language
dc.citation.endPage 26639 -
dc.citation.number 15 -
dc.citation.startPage 26632 -
dc.citation.title OPTICS EXPRESS -
dc.citation.volume 32 -
dc.contributor.author Rho, Yoonsoo -
dc.contributor.author Daeumer, Matthias A. -
dc.contributor.author Miller, Christopher F. -
dc.contributor.author Mah, Christopher M. -
dc.contributor.author Laurence, Ted A. -
dc.contributor.author Carr, Christopher W. -
dc.contributor.author Yoo, Jae Hyuck -
dc.date.accessioned 2024-09-02T09:35:07Z -
dc.date.available 2024-09-02T09:35:07Z -
dc.date.created 2024-08-30 -
dc.date.issued 2024-07 -
dc.description.abstract We use photoluminescence (PL) imaging to study damage growth precursors within laser damage sites on the surface of silica. Damage site evolution is induced by multiple shots of UV nanosecond pulsed laser at various energy densities and monitored throughout the early stages of growth. Wide-field PL imaging rapidly locates microscopic light absorption centers within the silica damage site. Our quantitative analysis shows that damage sites with strong local PL intensity show a higher probability of growth upon subsequent laser pulses. Scanning electron microscopy (SEM) paired with a study of PL spectrum shows that the strong PL intensity appears from the subsurface fractures with high defect density, which provides a local light absorption center leading to significant damage growth. We believe that this result offers an efficient optical damage mitigation strategy by providing a rapid and non-destructive optical inspection approach. (c) 2024 Optica Publishing Group under the terms of the Optica Open Access Publishing Agreement -
dc.identifier.bibliographicCitation OPTICS EXPRESS, v.32, no.15, pp.26632 - 26639 -
dc.identifier.doi 10.1364/OE.527241 -
dc.identifier.issn 1094-4087 -
dc.identifier.scopusid 2-s2.0-85198946183 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/83585 -
dc.identifier.wosid 001293219400006 -
dc.language 영어 -
dc.publisher Optica Publishing Group -
dc.title Photoluminescence probing of light absorption centers at silica laser damage -
dc.type Article -
dc.description.isOpenAccess TRUE -
dc.relation.journalWebOfScienceCategory Optics -
dc.relation.journalResearchArea Optics -
dc.type.docType Article -
dc.description.journalRegisteredClass scie -
dc.description.journalRegisteredClass scopus -
dc.subject.keywordPlus SITES -
dc.subject.keywordPlus PRECURSORS -
dc.subject.keywordPlus DEFECTS -
dc.subject.keywordPlus OPTICS -
dc.subject.keywordPlus UV -
dc.subject.keywordPlus FUSED-SILICA -
dc.subject.keywordPlus EXIT-SURFACE -
dc.subject.keywordPlus GROWTH-BEHAVIOR -
dc.subject.keywordPlus LARGE-APERTURE -

qrcode

Items in Repository are protected by copyright, with all rights reserved, unless otherwise indicated.