File Download

  • Find it @ UNIST can give you direct access to the published full text of this article. (UNISTARs only)
Related Researcher

정후영

Jeong, Hu Young
UCRF Electron Microscopy group
Read More

Views & Downloads

Detailed Information

Cited time in webofscience Cited time in scopus
Metadata Downloads

Direct observation of twisted stacking domains in the van der Waals magnet CrI3

Author(s)
Jang, MyeongjinLee, SolCantos-Prieto, FernandoKosic, IvonaLi, YueMcCray, Arthur R. C.Jung, Min-HyoungYoon, Jun-YeongBoddapati, LoukyaDeepak, Francis LeonardJeong, Hu YoungPhatak, Charudatta M.Santos, Elton J. G.Navarro-Moratalla, EfrenKim, Kwanpyo
Issued Date
2024-07
DOI
10.1038/s41467-024-50314-z
URI
https://scholarworks.unist.ac.kr/handle/201301/83444
Citation
NATURE COMMUNICATIONS, v.15, no.1, pp.5925
Abstract
Van der Waals (vdW) stacking is a powerful technique to achieve desired properties in condensed matter systems through layer-by-layer crystal engineering. A remarkable example is the control over the twist angle between artificially-stacked vdW crystals, enabling the realization of unconventional phenomena in moir & eacute; structures ranging from superconductivity to strongly correlated magnetism. Here, we report the appearance of unusual 120 degrees twisted faults in vdW magnet CrI3 crystals. In exfoliated samples, we observe vertical twisted domains with a thickness below 10 nm. The size and distribution of twisted domains strongly depend on the sample preparation methods, with as-synthesized unexfoliated samples showing tenfold thicker domains than exfoliated samples. Cooling induces changes in the relative populations among different twisting domains, rather than the previously assumed structural phase transition to the rhombohedral stacking. The stacking disorder induced by sample fabrication processes may explain the unresolved thickness-dependent magnetic coupling observed in CrI3.
Publisher
NATURE PORTFOLIO
ISSN
2041-1723
Keyword
FERROMAGNETISMCRYSTAL

qrcode

Items in Repository are protected by copyright, with all rights reserved, unless otherwise indicated.