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DC Field | Value | Language |
---|---|---|
dc.citation.endPage | 3792 | - |
dc.citation.number | 14 | - |
dc.citation.startPage | 3789 | - |
dc.citation.title | OPTICS LETTERS | - |
dc.citation.volume | 48 | - |
dc.contributor.author | Rho, Yoonsoo | - |
dc.contributor.author | Miller, Christopher F. | - |
dc.contributor.author | Yancey, Robin E. | - |
dc.contributor.author | Laurence, Ted A. | - |
dc.contributor.author | Carr, Christopher W. | - |
dc.contributor.author | Yoo, Jae-hyuck | - |
dc.date.accessioned | 2024-08-02T11:35:11Z | - |
dc.date.available | 2024-08-02T11:35:11Z | - |
dc.date.created | 2024-08-02 | - |
dc.date.issued | 2023-07 | - |
dc.description.abstract | We describe a wide-field approach to probe transient changes in photoluminescence (PL) of defects on silica surfaces. This technique allows simultaneous capture of spa-tially resolved PL with spontaneous quenching behavior. We attribute the quenching of PL intensity to photochemical reactions of surface defects and/or subsurface fractures with ambient molecules. Such quenching curves can be accurately reproduced by our theoretical model using two quench-able defect populations with different reaction rates. The fitting parameters of our model are spatially correlated to fractures in silica where point defects and mechani-cal stresses are known to be present, potentially indicating regions prone to laser-induced damage growth. We believe that our approach allows rapid spatial resolved identifica-tion of damage prone morphology, providing a new pathway to fast, non-destructive predictions of laser-induced damage growth.& COPY; 2023 Optica Publishing Group | - |
dc.identifier.bibliographicCitation | OPTICS LETTERS, v.48, no.14, pp.3789 - 3792 | - |
dc.identifier.doi | 10.1364/OL.494189 | - |
dc.identifier.issn | 0146-9592 | - |
dc.identifier.scopusid | 2-s2.0-85164755843 | - |
dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/83366 | - |
dc.identifier.wosid | 001043404700002 | - |
dc.language | 영어 | - |
dc.publisher | Optica Publishing Group | - |
dc.title | Wide-field probing of silica laser-induced damage precursors by photoluminescence photochemical quenching | - |
dc.type | Article | - |
dc.description.isOpenAccess | FALSE | - |
dc.relation.journalWebOfScienceCategory | Optics | - |
dc.relation.journalResearchArea | Optics | - |
dc.type.docType | Article | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.subject.keywordPlus | SURFACE | - |
dc.subject.keywordPlus | GROWTH | - |
dc.subject.keywordPlus | BAND | - |
dc.subject.keywordPlus | THRESHOLD | - |
dc.subject.keywordPlus | FUSED-SILICA | - |
dc.subject.keywordPlus | MORPHOLOGY | - |
dc.subject.keywordPlus | FRACTURE | - |
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