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김성일

Kim, Sungil
Data Analytics Lab.
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dc.citation.startPage 109936 -
dc.citation.title COMPUTERS & INDUSTRIAL ENGINEERING -
dc.citation.volume 189 -
dc.contributor.author Mun, Jong Hwan -
dc.contributor.author Yoo, Jitae -
dc.contributor.author Kim, Heesun -
dc.contributor.author Ryu, Nayi -
dc.contributor.author Kim, Sungil -
dc.date.accessioned 2024-03-26T10:05:08Z -
dc.date.available 2024-03-26T10:05:08Z -
dc.date.created 2024-03-25 -
dc.date.issued 2024-03 -
dc.description.abstract Detecting defective products at quality inspection stations is crucial. Consequently, modern production systems collect diverse sensor data during inspections to monitor the condition of products. However, a significant challenge in the pursuit of zero-defect manufacturing emerges with the presence of latent defects. These defects are not discoverable during the quality inspection phase and become apparent in the early stages of customer use. As a result, detecting such defects solely based on collected data becomes almost impossible. In this study, we introduce a novel functional outlier detection method that leverages domain knowledge to identify defective products, especially those with latent defects. The proposed method presents a systematic framework for integrating domain knowledge into the recently developed functional outlier detection method known as sequential transformations (Dai et al., 2020). To validate our proposed method’s effectiveness, we evaluated its performance using simulated data and real sensor data from refrigerator inspection lanes. -
dc.identifier.bibliographicCitation COMPUTERS & INDUSTRIAL ENGINEERING, v.189, pp.109936 -
dc.identifier.doi 10.1016/j.cie.2024.109936 -
dc.identifier.issn 0360-8352 -
dc.identifier.scopusid 2-s2.0-85184498609 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/81815 -
dc.identifier.wosid 001178508400001 -
dc.language 영어 -
dc.publisher Pergamon Press Ltd. -
dc.title Domain-knowledge-informed functional outlier detection for line quality control systems -
dc.type Article -
dc.description.isOpenAccess FALSE -
dc.relation.journalWebOfScienceCategory Computer Science, Interdisciplinary Applications;Engineering, Industrial -
dc.relation.journalResearchArea Computer Science;Engineering -
dc.type.docType Article -
dc.description.journalRegisteredClass scie -
dc.description.journalRegisteredClass scopus -
dc.subject.keywordAuthor Line quality control systems -
dc.subject.keywordAuthor Refrigerator manufacturing process -
dc.subject.keywordAuthor Quality inspection -
dc.subject.keywordPlus DIRECTIONAL OUTLYINGNESS -

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