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오태훈

Oh, Tae Hoon
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dc.citation.endPage 122 -
dc.citation.startPage 112 -
dc.citation.title JOURNAL OF PROCESS CONTROL -
dc.citation.volume 115 -
dc.contributor.author Son, Sang Hwan -
dc.contributor.author Kim, Jong Woo -
dc.contributor.author Oh, Tae Hoon -
dc.contributor.author Jeong, Dong Hwi -
dc.contributor.author Lee, Jong Min -
dc.date.accessioned 2024-03-13T10:05:12Z -
dc.date.available 2024-03-13T10:05:12Z -
dc.date.created 2024-03-13 -
dc.date.issued 2022-07 -
dc.description.abstract We propose an improved offset-free model predictive control (MPC) framework, which learns and utilizes the intrinsic model-plant mismatch map, to effectively exploit the advantages of model based and data-driven control strategies and overcome the limitation of each approach. In this study, the model-plant mismatch map on steady-state manifold is approximated via artificial neural network (ANN) modeling based on steady-state data from the process. Though the learned model plant mismatch map can provide the information at the equilibrium point (i.e., setpoint), it cannot provide model-plant mismatch information during transient state. To handle this, we additionally apply a supplementary disturbance variable which is updated from a revised disturbance estimator considering the disturbance value obtained from the learned model-plant mismatch map. Then, the learned and supplementary disturbance variables are applied to the target problem and finite-horizon optimal control problem of the offset-free MPC framework. By this, the control system can utilize both the learned model-plant mismatch information and the stabilizing property of the nominal disturbance estimator. The closed-loop simulation results demonstrate that the proposed offset-free MPC scheme utilizing the model-plant mismatch map learned via ANN modeling efficiently improves the closed-loop reference tracking performance of the control system. Additionally, the zero-offset tracking condition of the developed framework is mathematically examined. (C) 2022 Elsevier Ltd. All rights reserved. -
dc.identifier.bibliographicCitation JOURNAL OF PROCESS CONTROL, v.115, pp.112 - 122 -
dc.identifier.doi 10.1016/j.jprocont.2022.04.014 -
dc.identifier.issn 0959-1524 -
dc.identifier.scopusid 2-s2.0-85130233945 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/81575 -
dc.identifier.wosid 000809739600011 -
dc.language 영어 -
dc.publisher ELSEVIER SCI LTD -
dc.title Learning of model-plant mismatch map via neural network modeling and its application to offset-free model predictive control -
dc.type Article -
dc.description.isOpenAccess FALSE -
dc.relation.journalWebOfScienceCategory Automation & Control Systems; Engineering, Chemical -
dc.relation.journalResearchArea Automation & Control Systems; Engineering -
dc.type.docType Article; Early Access -
dc.description.journalRegisteredClass scie -
dc.description.journalRegisteredClass scopus -
dc.subject.keywordAuthor Model predictive control -
dc.subject.keywordAuthor Artificial neural network -
dc.subject.keywordAuthor Model-plant mismatch -
dc.subject.keywordAuthor Offset-free tracking -
dc.subject.keywordPlus MPC -
dc.subject.keywordPlus SYSTEMS -

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