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Lee, Zonghoon
Atomic-Scale Electron Microscopy Lab.
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DC Field Value Language
dc.citation.conferencePlace AT -
dc.citation.title 19th International Microscopy Conference -
dc.contributor.author Park, Hyo Ju -
dc.contributor.author Kim, Jung Hwa -
dc.contributor.author Lee, Zonghoon -
dc.date.accessioned 2024-02-01T01:36:23Z -
dc.date.available 2024-02-01T01:36:23Z -
dc.date.created 2018-10-22 -
dc.date.issued 2018-09-12 -
dc.identifier.bibliographicCitation 19th International Microscopy Conference -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/80936 -
dc.language 영어 -
dc.publisher Australian microscopy & microanalysis society, International Federation of Societies for Microscopy -
dc.title Screw Dislocation-Driven Growth of Double-Helical Hexagonal Boron Nitride -
dc.type Conference Paper -
dc.date.conferenceDate 2018-09-09 -

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