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김진국

Kim, Jingook
Integrated Circuit and Electromagnetic Compatibility Lab.
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dc.citation.conferencePlace US -
dc.citation.title 40th Annual Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2018 -
dc.contributor.author Park, Junsik -
dc.contributor.author Lee, Jongsung -
dc.contributor.author Jo, Cheolgu -
dc.contributor.author Seol, Byoungsu -
dc.contributor.author Kim, Jingook -
dc.date.accessioned 2024-02-01T01:36:03Z -
dc.date.available 2024-02-01T01:36:03Z -
dc.date.created 2018-12-20 -
dc.date.issued 2018-09-23 -
dc.description.abstract A proto-type ESD generator for system immunity test of wearable devices is proposed. A wearable device is charged up to an ESD test voltage together with the designed ESD generator, and discharged to the ESD current target. The proposed ESD generator for wearable devices is validated with a real ESD measurement. -
dc.identifier.bibliographicCitation 40th Annual Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2018 -
dc.identifier.doi 10.23919/EOS/ESD.2018.8509740 -
dc.identifier.isbn 1585373028 -
dc.identifier.issn 0739-5159 -
dc.identifier.scopusid 2-s2.0-85056835132 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/80887 -
dc.identifier.url https://ieeexplore.ieee.org/document/8509740 -
dc.language 영어 -
dc.publisher 40th Annual Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2018 -
dc.title A proto-type ESD generator for system immunity test of wearable devices -
dc.type Conference Paper -
dc.date.conferenceDate 2018-09-23 -

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