Comparison and Application of Two Approaches Extracting Equivalent Dipole Arrays of an IC from Measured Near-Field Magnitude Data

Abstract

Two approaches to extract equivalent dipole arrays of integrated circuits (ICs) from only magnitude information of near-field scanning data are compared and applied to a test IC. One approach is based on the nonlinear least square (NLS) fitting, and the other is extracting the dipoles from the complex field data after retrieving the field phases. Using a commercial simulation tool, the extracted dipole arrays are tested to estimate the fields caused by the IC with- and without- an additional shielding structure.