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Kim, Jingook
Integrated Circuit and Electromagnetic Compatibility Laboratory (IC & EMC Lab)
Research Interests
  • Convergence between circuit and EM domains

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Physics-Based Inductance Extraction for Via Arrays in Parallel Planes for Power Distribution Network Design

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dc.contributor.author Kim, Jingook ko
dc.contributor.author Ren, Liehui ko
dc.contributor.author Fan, Jun ko
dc.date.available 2014-10-30T00:08:35Z -
dc.date.created 2014-10-29 ko
dc.date.issued 2010-09 -
dc.identifier.citation IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, v.58, no.9, pp.2434 - 2447 ko
dc.identifier.issn 0018-9480 ko
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/7972 -
dc.identifier.uri http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=77956615453 ko
dc.description.abstract A systematic approach for inductance extraction for via arrays between two parallel planes is presented. Both self and mutual inductance values are obtained based on a cavity model. The physics associated with the via inductances is analyzed, and a rigorous method is developed to derive an equivalent total inductance for multiple via arrays. Analytical equations for the equivalent total inductance are derived in closed forms for simple cases. The proposed method is corroborated with measurements, and application of the method for power distribution network designs is demonstrated. ko
dc.description.statementofresponsibility close -
dc.language ENG ko
dc.publisher IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC ko
dc.subject Cavity model ko
dc.subject decoupling capacitor ko
dc.subject equivalent total inductance ko
dc.subject integrated circuit (IC) pin layout ko
dc.subject parallel planes ko
dc.subject power distribution network (PDN) ko
dc.subject via inductance extraction ko
dc.title Physics-Based Inductance Extraction for Via Arrays in Parallel Planes for Power Distribution Network Design ko
dc.type ARTICLE ko
dc.identifier.scopusid 2-s2.0-77956615453 ko
dc.identifier.wosid 000283251100014 ko
dc.type.rims ART ko
dc.description.wostc 18 *
dc.description.scopustc 24 *
dc.date.tcdate 2015-05-06 *
dc.date.scptcdate 2014-10-29 *
dc.identifier.doi 10.1109/TMTT.2010.2058278 ko
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