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dc.citation.conferencePlace JA -
dc.citation.endPage C131 -
dc.citation.startPage C130 -
dc.citation.title 33rd Symposium on VLSI Circuits, VLSI Circuits 2019 -
dc.contributor.author Lee, Jeonghyun -
dc.contributor.author Bang, Jooeun -
dc.contributor.author Lim, Younghyun -
dc.contributor.author Choi, Jaehyouk -
dc.date.accessioned 2024-02-01T00:09:16Z -
dc.date.available 2024-02-01T00:09:16Z -
dc.date.created 2020-01-29 -
dc.date.issued 2019-06-09 -
dc.description.abstract This work presents a digital LDO using a single-VCO-based edge-racing (SVER) time quantizer to achieve fast transient and high accuracy concurrently. As the SVER scales the sampling frequency dynamically according to the magnitude of the error in the output voltage, the transient response can be improved without the increase in the power consumption in the steady state. Since the SVER uses a single VCO, the accuracy of the output can be high against local mismatches. In measurement, this LDO achieved a 0.29 ps-transient FOM and a sub-2 mV accuracy under 0.5-V supply. -
dc.identifier.bibliographicCitation 33rd Symposium on VLSI Circuits, VLSI Circuits 2019, pp.C130 - C131 -
dc.identifier.doi 10.23919/VLSIC.2019.8777999 -
dc.identifier.issn 0000-0000 -
dc.identifier.scopusid 2-s2.0-85073914900 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/79691 -
dc.identifier.url https://ieeexplore.ieee.org/document/8777999 -
dc.language 영어 -
dc.publisher Institute of Electrical and Electronics Engineers Inc. -
dc.title A 0.5V-VIN, 0.29ps-Transient-FOM, and Sub-2mV-Accuracy Adaptive-Sampling Digital LDO Using Single-VCO-Based Edge-Racing Time Quantizer -
dc.type Conference Paper -
dc.date.conferenceDate 2019-06-09 -

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