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- Kim, Kyung Rok
- Nano-Electronic Emerging Devices Lab.
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Performance enhancement of non-resonant plasmonic THz detector by internal gate-source overlap capacitance in Si FET
- Author(s)
- Jang, E-San, Ryu, Min Woo, Ahn, Sanh Hyo, Kim, Kyung Rok
- Issued Date
- 2019-06-27
- Citation
- 대한전자공학회 2019년도 하계종합학술대회
- Publisher
- 대한전자공학회
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