dc.citation.conferencePlace |
US |
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dc.citation.conferencePlace |
New Orleans |
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dc.citation.endPage |
160 |
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dc.citation.startPage |
156 |
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dc.citation.title |
IEEE International Symposium on Electromagnetic Compatibility, Signal and Power Integrity |
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dc.contributor.author |
Lee, Wooryong |
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dc.contributor.author |
Park, Junsik |
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dc.contributor.author |
Kim, Jingook |
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dc.contributor.author |
Ryu, Chunghyun |
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dc.contributor.author |
Lee, Jongsung |
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dc.contributor.author |
Kang, Bonggyu |
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dc.contributor.author |
Bae, Bumhee |
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dc.date.accessioned |
2024-02-01T00:06:36Z |
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dc.date.available |
2024-02-01T00:06:36Z |
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dc.date.created |
2019-10-25 |
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dc.date.issued |
2019-07-22 |
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dc.description.abstract |
An on-die oscilloscope circuit is proposed for monitoring of system-level electrostatic discharge (ESD) noises at a power supply or signal line of an integrated circuit (IC). The noise waveform is sampled and converted to digital data in real time. ESD event detector circuits provide a trigger signal for holding the digital data when the ESD event is detected. The digital data are converted back to analog noise waveforms through post-processing. The operations of the proposed on-die oscilloscope circuit are validated in circuit simulations. |
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dc.identifier.bibliographicCitation |
IEEE International Symposium on Electromagnetic Compatibility, Signal and Power Integrity, pp.156 - 160 |
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dc.identifier.doi |
10.1109/ISEMC.2019.8825235 |
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dc.identifier.scopusid |
2-s2.0-85073052949 |
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dc.identifier.uri |
https://scholarworks.unist.ac.kr/handle/201301/79474 |
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dc.identifier.url |
https://ieeexplore.ieee.org/document/8825235 |
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dc.language |
영어 |
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dc.publisher |
Institute of Electrical and Electronics Engineers |
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dc.title |
An On-die Oscilloscope for System-Level ESD Noise Monitoring |
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dc.type |
Conference Paper |
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dc.date.conferenceDate |
2019-07-22 |
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