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김진국

Kim, Jingook
Integrated Circuit and Electromagnetic Compatibility Lab.
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dc.citation.conferencePlace US -
dc.citation.conferencePlace New Orleans -
dc.citation.endPage 252 -
dc.citation.startPage 247 -
dc.citation.title 2019 IEEE International Symposium on Electromagnetic Compatibility, Signal and Power Integrity, EMC+SIPI 2019 -
dc.contributor.author Jeong, Sangyeong -
dc.contributor.author Kim, Jingook -
dc.date.accessioned 2024-02-01T00:06:36Z -
dc.date.available 2024-02-01T00:06:36Z -
dc.date.created 2019-10-25 -
dc.date.issued 2019-07-22 -
dc.description.abstract Improvement of surge immunity due to transformer-isolation in an active EMI filter (AEF) is investigated. The surge influence on active circuit parts is analyzed by experiments. Maximum peak voltage and pulse duration of the surge transient voltages transferred to active circuit parts of a current-sense current-compensation (CSCC) AEF are measured in the cases with direct capacitive coupling and transformer-isolated coupling, respectively. The surge immunity of the designed transformer-isolated CSCC AEF is validated under numerous 4kV surge tests and VNA measurement. -
dc.identifier.bibliographicCitation 2019 IEEE International Symposium on Electromagnetic Compatibility, Signal and Power Integrity, EMC+SIPI 2019, pp.247 - 252 -
dc.identifier.doi 10.1109/ISEMC.2019.8825250 -
dc.identifier.issn 0000-0000 -
dc.identifier.scopusid 2-s2.0-85073059340 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/79473 -
dc.identifier.url https://ieeexplore.ieee.org/document/8825250 -
dc.language 영어 -
dc.publisher Institute of Electrical and Electronics Engineers -
dc.title Improvement of Surge Immunity by Using Transformer-isolation in an Active EMI Filter -
dc.type Conference Paper -
dc.date.conferenceDate 2019-07-22 -

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