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- Yang, Hyun Jong
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| DC Field | Value | Language |
|---|---|---|
| dc.citation.conferencePlace | US | - |
| dc.citation.title | Microscopy and Microanalysis 2019 | - |
| dc.contributor.author | Kim, Huisoo | - |
| dc.contributor.author | Oh, Moohyun | - |
| dc.contributor.author | Lee, Heerang | - |
| dc.contributor.author | Jang, Jonggyu | - |
| dc.contributor.author | Kim, Myeung Un | - |
| dc.contributor.author | Yang, Hyun Jong | - |
| dc.contributor.author | Ryoo, Michael | - |
| dc.contributor.author | Lee, Junhee | - |
| dc.date.accessioned | 2024-02-01T00:06:14Z | - |
| dc.date.available | 2024-02-01T00:06:14Z | - |
| dc.date.created | 2020-01-09 | - |
| dc.date.issued | 2019-08-05 | - |
| dc.identifier.bibliographicCitation | Microscopy and Microanalysis 2019 | - |
| dc.identifier.doi | 10.1017/S1431927619001648 | - |
| dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/79421 | - |
| dc.identifier.url | https://www.cambridge.org/core/journals/microscopy-and-microanalysis/article/deeplearning-based-autofocus-score-prediction-of-scanning-electron-microscope/2A5B35793BF5DD59749D1D5EAE5E9CC9 | - |
| dc.publisher | Microscopy Society of America | - |
| dc.title | Deep-Learning Based Autofocus Score Prediction of Scanning Electron Microscope | - |
| dc.type | Conference Paper | - |
| dc.date.conferenceDate | 2019-08-04 | - |
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