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- Yang, Seungjoon
- Signal Processing Lab .
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| DC Field | Value | Language |
|---|---|---|
| dc.citation.endPage | 723 | - |
| dc.citation.number | 3 | - |
| dc.citation.startPage | 719 | - |
| dc.citation.title | IEEE TRANSACTIONS ON CONSUMER ELECTRONICS | - |
| dc.citation.volume | 49 | - |
| dc.contributor.author | Yang, Seungjoon | - |
| dc.contributor.author | Lee, YH | - |
| dc.contributor.author | Yu, P | - |
| dc.date.accessioned | 2023-12-22T11:10:16Z | - |
| dc.date.available | 2023-12-22T11:10:16Z | - |
| dc.date.created | 2014-10-28 | - |
| dc.date.issued | 2003-08 | - |
| dc.description.abstract | Analog images often exhibit line-wise differences due to incorrectly restored DC levels. This paper presents a novel DC restoration error correction method based on the statistical hypothesis testing. The proposed method can remove the line-wise error in analog images introduced during the DC restoration processes. | - |
| dc.identifier.bibliographicCitation | IEEE TRANSACTIONS ON CONSUMER ELECTRONICS, v.49, no.3, pp.719 - 723 | - |
| dc.identifier.issn | 0098-3063 | - |
| dc.identifier.scopusid | 2-s2.0-0141888959 | - |
| dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/7925 | - |
| dc.identifier.url | http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=0141888959 | - |
| dc.identifier.wosid | 000185192700038 | - |
| dc.language | 영어 | - |
| dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | - |
| dc.title | Neyman-Pearson test for DC restoration error correction | - |
| dc.type | Article | - |
| dc.description.journalRegisteredClass | scopus | - |
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