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- Lee, Zonghoon
- Atomic-Scale Electron Microscopy Lab.
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| DC Field | Value | Language |
|---|---|---|
| dc.citation.conferencePlace | KO | - |
| dc.citation.title | 2019 한국현미경학회 추계학술대회 | - |
| dc.contributor.author | Lee, Zonghoon | - |
| dc.date.accessioned | 2024-01-31T23:11:31Z | - |
| dc.date.available | 2024-01-31T23:11:31Z | - |
| dc.date.created | 2021-01-07 | - |
| dc.date.issued | 2019-11-15 | - |
| dc.identifier.bibliographicCitation | 2019 한국현미경학회 추계학술대회 | - |
| dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/78835 | - |
| dc.publisher | 한국현미경학회 | - |
| dc.title | Investigation of two-dimensional growth of materials using atomic-resolution TEM | - |
| dc.type | Conference Paper | - |
| dc.date.conferenceDate | 2019-11-14 | - |
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