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- Lee, Zonghoon
- Atomic-Scale Electron Microscopy Lab.
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| DC Field | Value | Language |
|---|---|---|
| dc.citation.conferencePlace | II | - |
| dc.citation.title | 12th Asia-Pacific Microscopy Conference | - |
| dc.contributor.author | Lee, Suk Woo | - |
| dc.contributor.author | Yoon, Jongchan | - |
| dc.contributor.author | Lee, Zonghoon | - |
| dc.date.accessioned | 2024-01-31T23:08:08Z | - |
| dc.date.available | 2024-01-31T23:08:08Z | - |
| dc.date.created | 2021-01-06 | - |
| dc.date.issued | 2020-02-03 | - |
| dc.identifier.bibliographicCitation | 12th Asia-Pacific Microscopy Conference | - |
| dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/78620 | - |
| dc.publisher | Electron Microscope Society of India | - |
| dc.title | Investigation of sub-nanometer superlattice through directional intercalation in black phosphorus | - |
| dc.type | Conference Paper | - |
| dc.date.conferenceDate | 2020-02-02 | - |
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