BROWSE

Related Researcher

Author's Photo

Kim, Youngmin
Nano-scale(system) Design & Automation Lab
Research Interests
  • Design & Technology Co-Optimization (DTCO)
  • Variability-Aware and Robust Design Methodologies
  • Design for Manufacturability/Variability (DFM/V)
  • Low-Power and High Performance Circuit Design
  • 3D IC with TSV

ITEM VIEW & DOWNLOAD

Simple and Accurate Models for Capacitance Considering Floating Metal Fill Insertion

Cited 2 times inthomson ciCited 4 times inthomson ci
Title
Simple and Accurate Models for Capacitance Considering Floating Metal Fill Insertion
Author
Kim, YoungminPetranovic, D.Sylvester, D.
Keywords
Capacitance; Design; Integrated circuits (ICs); Interconnects
Issue Date
2009-08
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Citation
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, v.17, no.8, pp.1166 - 1170
Abstract
In this paper, we analyze and model the impact of floating dummy fill on the signal capacitance considering various parameters including signal dimensions, dummy shape and dimensions. Intra-layer dummy has its greatest impact on coupling capacitance while inter-layer dummy has larger impact on the ground capacitance component. Based on this analysis, we propose simple capacitance models (Cc for intra-layer dummy and Cg for inter-layer dummy). To consider realistic cases with both signals and metal fill in adjacent layers, we apply a weighting function approach to the Cg model. We verify this model using benchmark circuits and find that total net capacitance with floating fill can be extracted within similar to 1% of field solver results on average with total extraction runtime reductions of up to 40%. When evaluating the incremental capacitance due to fill alone, average error of the models range from 2%-15% across benchmarks and fill-related runtime overhead is reduced by 60%-88%.
URI
Go to Link
DOI
10.1109/TVLSI.2009.2020392
ISSN
1063-8210
Appears in Collections:
EE_Journal Papers
Files in This Item:
2-s2.0-68549115189.pdf Download

find_unist can give you direct access to the published full text of this article. (UNISTARs only)

Show full item record

qrcode

  • mendeley

    citeulike

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

MENU