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심재영

Sim, Jae-Young
Visual Information Processing Lab.
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DC Field Value Language
dc.citation.conferencePlace US -
dc.citation.title IEEE Conference on Computer Vision and Pattern Recognition -
dc.contributor.author Lee, Kyu-Yul -
dc.contributor.author Sim, Jae-Young -
dc.date.accessioned 2024-01-31T23:06:40Z -
dc.date.available 2024-01-31T23:06:40Z -
dc.date.created 2020-11-05 -
dc.date.issued 2020-06-17 -
dc.identifier.bibliographicCitation IEEE Conference on Computer Vision and Pattern Recognition -
dc.identifier.scopusid 2-s2.0-85094836881 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/78485 -
dc.publisher IEEE -
dc.title Warping residual based image stitching for large parallax -
dc.type Conference Paper -
dc.date.conferenceDate 2020-06-14 -

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