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Yoo, Jaejun
Lab. of Advanced Imaging Technology
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dc.citation.conferencePlace US -
dc.citation.conferencePlace Online -
dc.citation.endPage 7142 -
dc.citation.startPage 7133 -
dc.citation.title IEEE International Conference on Machine Learning -
dc.contributor.author Naeem, Muhammad Ferjad -
dc.contributor.author Oh, Seong Joon -
dc.contributor.author Uh, Youngjung -
dc.contributor.author Choi, Yunjey -
dc.contributor.author Yoo, Jaejun -
dc.date.accessioned 2024-01-31T23:06:33Z -
dc.date.available 2024-01-31T23:06:33Z -
dc.date.created 2021-08-19 -
dc.date.issued 2020-07 -
dc.description.abstract Devising indicative evaluation metrics for the image generation task remains an open problem. The most widely used metric for measuring the similarity between real and generated images has been the Fréchet Inception Distance (FID) score. Because it does not differentiate the fidelity and diversity aspects of the generated images, recent papers have introduced variants of precision and recall metrics to diagnose those properties separately. In this paper, we show that even the latest version of the precision and recall metrics are not reliable yet; for example, they fail to detect the match between two identical distributions, they are not robust against outliers, and the evaluation hyperparameters are selected arbitrarily. We propose density and coverage metrics that solve the above issues. We analytically and experimentally show that density and coverage provide more interpretable and reliable signals for practitioners than the existing metrics. -
dc.identifier.bibliographicCitation IEEE International Conference on Machine Learning, pp.7133 - 7142 -
dc.identifier.issn 0000-0000 -
dc.identifier.scopusid 2-s2.0-85097259420 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/78471 -
dc.identifier.url https://arxiv.org/abs/2002.09797 -
dc.language 영어 -
dc.publisher International Machine Learning Society (IMLS) -
dc.title Reliable fidelity and diversity metrics for generative models -
dc.type Conference Paper -
dc.date.conferenceDate 2020-07-13 -

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