Synchrotron radiation applications to study the structure property relationship of halide perovskite materials

Abstract

Recently, halide perovskite solar cells have achieved 25.2% photo-to-power conversion efficiency in small-sized cells [1], which has high expectation for commercialization. However, for the final commercialization of halide perovskite solar cells, manufacturing costs should be lowered, large area efficiency should be increased, and long-term stability against external environments (temperature, humidity, light illumination, and etc.) must be improved [2]. To meet these demands, detailed structural understanding of perovskite materials and structural changes according to external environment, design and synthesis of new materials based on these understandings, and other key layers (ETL, HTL, and etc.) that make up solar cells should be optimized. In this presentation, the basics and applications of various in-situ and ex-situ synchrotron X-ray experiments (XRD, GIXD, and XAFS) on halide perovskite thin films, which have recently received a lot of attention among energy conversion materials and numerous studies are actively being conducted, are introduced. In order to study the structure-property correlation of perovskite thin films, this study includes not only the structure at room temperature, but also at low and high temperature structure and phase transformation, the long-term storage behavior under atmospheric and vacuum condition, and the behavior under light irradiation. References: [1] NREL, Best Research-Cell Efficiency Chart, https://www.nrel.gov/pv/cell-efficiency.html. [2] Y. Rong et al., Science 361, eaat8235 (2018); G. Divitini et al., Nature Energy 1, 1-6 (2016); T. A. Berhe et al., Energy Environ. Sci., 9, 323 (2016); H. Zhang et al., Nat. Commun., 10, 1-8 (2019). Acknowledgement: This work was supported by NRF-2018R1A5A 1025224 and CAP-18-05-KAERI.