File Download

There are no files associated with this item.

  • Find it @ UNIST can give you direct access to the published full text of this article. (UNISTARs only)
Related Researcher

박장웅

Park, Jang-Ung
Read More

Views & Downloads

Detailed Information

Cited time in webofscience Cited time in scopus
Metadata Downloads

Full metadata record

DC Field Value Language
dc.citation.endPage 8068 -
dc.citation.number 17 -
dc.citation.startPage 8058 -
dc.citation.title LANGMUIR -
dc.citation.volume 21 -
dc.contributor.author Huang, YGY -
dc.contributor.author Zhou, WX -
dc.contributor.author Hsia, KJ -
dc.contributor.author Menard, E -
dc.contributor.author Park, Jang-Ung -
dc.contributor.author Rogers, JA -
dc.contributor.author Alleyne, AG -
dc.date.accessioned 2023-12-22T10:15:03Z -
dc.date.available 2023-12-22T10:15:03Z -
dc.date.created 2014-10-24 -
dc.date.issued 2005-08 -
dc.description.abstract We have studied the so-called roof collapse in soft lithography. Roof collapse is due to the adhesion between the PDMS stamp and substrate, and it may affect the quality of soft lithography. Our analysis accounts for the interactions of multiple punches and the effect of elastic mismatch between the PDMS stamp and substrate. A scaling law among the stamp modulus, punch height and spacing, and work of adhesion between the stamp and substrate is established. Such a scaling law leads to a simple criterion against the unwanted roof collapse. The present study agrees well with the experimental data. -
dc.identifier.bibliographicCitation LANGMUIR, v.21, no.17, pp.8058 - 8068 -
dc.identifier.doi 10.1021/la0502185 -
dc.identifier.issn 0743-7463 -
dc.identifier.scopusid 2-s2.0-29144450768 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/7739 -
dc.identifier.url http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=29144450768 -
dc.identifier.wosid 000231389200062 -
dc.language 영어 -
dc.publisher AMER CHEMICAL SOC -
dc.title Stamp collapse in soft lithography -
dc.type Article -
dc.description.journalRegisteredClass scopus -

qrcode

Items in Repository are protected by copyright, with all rights reserved, unless otherwise indicated.