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- Lee, Zonghoon
- Atomic-Scale Electron Microscopy Lab.
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| DC Field | Value | Language |
|---|---|---|
| dc.citation.conferencePlace | KO | - |
| dc.citation.conferencePlace | Online | - |
| dc.citation.title | 2021 한국현미경학회 춘계학술대회 | - |
| dc.contributor.author | Lee, Zonghoon | - |
| dc.date.accessioned | 2024-01-31T21:40:59Z | - |
| dc.date.available | 2024-01-31T21:40:59Z | - |
| dc.date.created | 2021-10-12 | - |
| dc.date.issued | 2021-06-03 | - |
| dc.identifier.bibliographicCitation | 2021 한국현미경학회 춘계학술대회 | - |
| dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/77324 | - |
| dc.publisher | 한국현미경학회 | - |
| dc.title | Advances in two-dimensional materials research using aberration-corrected TEM/STEM | - |
| dc.type | Conference Paper | - |
| dc.date.conferenceDate | 2021-06-03 | - |
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