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- Kim, Ju-Young
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| DC Field | Value | Language |
|---|---|---|
| dc.citation.conferencePlace | KO | - |
| dc.citation.title | 2021 한국전지전자재료학회 하계학술대회 | - |
| dc.contributor.author | 김주영 | - |
| dc.contributor.author | 김한글 | - |
| dc.contributor.author | 김시훈 | - |
| dc.contributor.author | 채한기 | - |
| dc.contributor.author | 곽상규 | - |
| dc.date.accessioned | 2024-01-31T21:39:09Z | - |
| dc.date.available | 2024-01-31T21:39:09Z | - |
| dc.date.created | 2022-01-03 | - |
| dc.date.issued | 2021-07-01 | - |
| dc.identifier.bibliographicCitation | 2021 한국전지전자재료학회 하계학술대회 | - |
| dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/77214 | - |
| dc.publisher | 한국전지전자재료학회 | - |
| dc.title | 구리 TSV (through silicon via) 주변 잔류응력 측정 | - |
| dc.type | Conference Paper | - |
| dc.date.conferenceDate | 2021-06-30 | - |
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