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김주영

Kim, Ju-Young
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dc.citation.endPage 1340 -
dc.citation.startPage 1337 -
dc.citation.title Diffusion and Defect Data Pt.B: Solid State Phenomena -
dc.citation.volume 124-126 -
dc.contributor.author Kim, Ju-Young -
dc.contributor.author Lee, Jung-Jun -
dc.contributor.author Lee, Yun-Hee -
dc.contributor.author Jang, Jae-Il -
dc.contributor.author Kwon, Dongil -
dc.date.accessioned 2023-12-22T09:13:52Z -
dc.date.available 2023-12-22T09:13:52Z -
dc.date.created 2014-10-23 -
dc.date.issued 2007-06 -
dc.description.abstract Surface roughness is main source of error in instrumented microindentation when it is not negligible relative to the indentation depth. The effect of a rough surface on the results of instrumented microindentation testing using spherical indenter was analyzed by applying the contact depth model, which takes surface roughness into account. Improved variations in hardness and Young's modulus were shown for W and Ni when the results were analyzed by this rough-surface model, while these values were underestimated with increasing surface roughness when analyzed by the flat-surface model. The deformation state of asperities underneath spherical indenter was also discussed. -
dc.identifier.bibliographicCitation Diffusion and Defect Data Pt.B: Solid State Phenomena, v.124-126, pp.1337 - 1340 -
dc.identifier.doi 10.4028/www.scientific.net/SSP.124-126.1337 -
dc.identifier.issn 1012-0394 -
dc.identifier.scopusid 2-s2.0-38549148984 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/7650 -
dc.identifier.url https://www.scientific.net/SSP.124-126.1337 -
dc.language 영어 -
dc.publisher Scientific.net -
dc.title Effects of rough surface on contact depth for instrumented microindentation using spherical lndenter -
dc.type Article -
dc.description.journalRegisteredClass scopus -

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