dc.citation.endPage |
180 |
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dc.citation.number |
1 |
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dc.citation.startPage |
174 |
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dc.citation.title |
JOM |
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dc.citation.volume |
64 |
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dc.contributor.author |
Daniels, John E. |
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dc.contributor.author |
Jo, Wook |
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dc.contributor.author |
Donner, Wolfgang |
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dc.date.accessioned |
2023-12-22T05:36:59Z |
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dc.date.available |
2023-12-22T05:36:59Z |
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dc.date.created |
2014-10-21 |
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dc.date.issued |
2012-01 |
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dc.description.abstract |
High-energy synchrotron x-ray scattering offers a powerful technique for investigation of single-crystal material structures. Large, mm-sized crystals can be used, allowing complex in situ sample environments to be employed. Here, we demonstrate how this technique can be applied for the collection of single-crystal diffuse scattering volumes from the electro-active material 96%Bi0.5Na0.5TiO3-4%BaTiO3 while electric fields are applied in situ. The data obtained allow correlation of the atomic and nanoscale structures with the observed macroscopic electro-active properties of interest. This article presents a recent study relating the nanoscale stacking fault structure in BNT-BT to the relaxor-ferroelectric nature of the material [Daniels et al. in Appl. Phys. Lett. 98, 252904 (2011)], and extends this study with further experimental description and analysis. |
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dc.identifier.bibliographicCitation |
JOM, v.64, no.1, pp.174 - 180 |
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dc.identifier.doi |
10.1007/s11837-011-0230-z |
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dc.identifier.issn |
1047-4838 |
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dc.identifier.scopusid |
2-s2.0-84857651443 |
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dc.identifier.uri |
https://scholarworks.unist.ac.kr/handle/201301/7541 |
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dc.identifier.url |
http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=84857651443 |
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dc.identifier.wosid |
000300773000026 |
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dc.language |
영어 |
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dc.publisher |
SPRINGER |
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dc.title |
High-energy synchrotron x-ray diffraction for in situ diffuse scattering studies of bulk single crystals |
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dc.type |
Article |
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dc.description.journalRegisteredClass |
scie |
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dc.description.journalRegisteredClass |
scopus |
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