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DC Field | Value | Language |
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dc.citation.endPage | 180 | - |
dc.citation.number | 1 | - |
dc.citation.startPage | 174 | - |
dc.citation.title | JOM | - |
dc.citation.volume | 64 | - |
dc.contributor.author | Daniels, John E. | - |
dc.contributor.author | Jo, Wook | - |
dc.contributor.author | Donner, Wolfgang | - |
dc.date.accessioned | 2023-12-22T05:36:59Z | - |
dc.date.available | 2023-12-22T05:36:59Z | - |
dc.date.created | 2014-10-21 | - |
dc.date.issued | 2012-01 | - |
dc.description.abstract | High-energy synchrotron x-ray scattering offers a powerful technique for investigation of single-crystal material structures. Large, mm-sized crystals can be used, allowing complex in situ sample environments to be employed. Here, we demonstrate how this technique can be applied for the collection of single-crystal diffuse scattering volumes from the electro-active material 96%Bi0.5Na0.5TiO3-4%BaTiO3 while electric fields are applied in situ. The data obtained allow correlation of the atomic and nanoscale structures with the observed macroscopic electro-active properties of interest. This article presents a recent study relating the nanoscale stacking fault structure in BNT-BT to the relaxor-ferroelectric nature of the material [Daniels et al. in Appl. Phys. Lett. 98, 252904 (2011)], and extends this study with further experimental description and analysis. | - |
dc.identifier.bibliographicCitation | JOM, v.64, no.1, pp.174 - 180 | - |
dc.identifier.doi | 10.1007/s11837-011-0230-z | - |
dc.identifier.issn | 1047-4838 | - |
dc.identifier.scopusid | 2-s2.0-84857651443 | - |
dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/7541 | - |
dc.identifier.url | http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=84857651443 | - |
dc.identifier.wosid | 000300773000026 | - |
dc.language | 영어 | - |
dc.publisher | SPRINGER | - |
dc.title | High-energy synchrotron x-ray diffraction for in situ diffuse scattering studies of bulk single crystals | - |
dc.type | Article | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
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