dc.citation.endPage |
H81 |
- |
dc.citation.number |
9 |
- |
dc.citation.startPage |
H79 |
- |
dc.citation.title |
ELECTROCHEMICAL AND SOLID STATE LETTERS |
- |
dc.citation.volume |
8 |
- |
dc.contributor.author |
Kim, SY |
- |
dc.contributor.author |
Baik, Jeong Min |
- |
dc.contributor.author |
Lee, JL |
- |
dc.date.accessioned |
2023-12-22T10:39:48Z |
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dc.date.available |
2023-12-22T10:39:48Z |
- |
dc.date.created |
2014-10-17 |
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dc.date.issued |
2005 |
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dc.description.abstract |
4,4'-Bis[N-1-naphthyl)-N-phenylamino]biphenyl (alpha-NPD) was deposited in situ on both ruthenium oxide-coated indium-tin oxide (RuOx-ITO) and O-2-plasma-treated ITO (O-2-ITO) anodes, and their interface dipole energies were quantitatively determined using synchrotron radiation photoemission spectroscopy. The dipole energy of RuOx-ITO was lower by 0.2 eV than that of O-2-ITO even though RuOx-ITO had a higher work function. Secondary electron emission spectra after deposition of alpha-NPD on anodes revealed that the work function of RuOx-ITO is higher by 0.2 eV than that of O-2-ITO, resulting in a decrease of the turn-on voltage via reduction of hole injection barrier. |
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dc.identifier.bibliographicCitation |
ELECTROCHEMICAL AND SOLID STATE LETTERS, v.8, no.9, pp.H79 - H81 |
- |
dc.identifier.doi |
10.1149/1.1996510 |
- |
dc.identifier.issn |
1099-0062 |
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dc.identifier.scopusid |
2-s2.0-25144437010 |
- |
dc.identifier.uri |
https://scholarworks.unist.ac.kr/handle/201301/7403 |
- |
dc.identifier.url |
http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=25144437010 |
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dc.identifier.wosid |
000231259500042 |
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dc.language |
영어 |
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dc.publisher |
ELECTROCHEMICAL SOC INC |
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dc.title |
Determination of interface dipole energy at the interface of ruthenium-oxide-coated anode with organic material using synchrotron radiation photoemission spectroscopy |
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dc.type |
Article |
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dc.description.journalRegisteredClass |
scopus |
- |