Wettability of nanoengineered dual-roughness surfaces fabricated by UV-assisted capillary force lithography
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Jeong, Hoon Eui | ko |
dc.contributor.author | Kwak, Moon Kyu | ko |
dc.contributor.author | Park, Chan Ick | ko |
dc.contributor.author | Suh, Kahp Yang | ko |
dc.date.available | 2014-10-17T08:39:17Z | - |
dc.date.created | 2014-10-17 | ko |
dc.date.issued | 2009-11 | - |
dc.identifier.citation | JOURNAL OF COLLOID AND INTERFACE SCIENCE, v.339, no.1, pp.202 - 207 | ko |
dc.identifier.issn | 0021-9797 | ko |
dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/7378 | - |
dc.identifier.uri | https://linkinghub.elsevier.com/retrieve/pii/S0021979709009084 | ko |
dc.description.abstract | Micro- and nanoscale combined hierarchical polymer structures were fabricated by UV-assisted capillary force lithography. The method is based on the sequential application of engraved polymer molds with a UV-curable resin of polyurethane acrylate (PUA) followed by surface treatment with a trichloro(1H,1H,2H,2H-perfluorooctyl) silane in vapor phase. Two distinct wetting states were observed on these dual-roughness structures. One is "Cassie-Wenzel state" where a water droplet forms heterogeneous contact with microstructures and homogeneous contact with nanostructures. The other is "Cassie-Cassie state" where a droplet makes heterogeneous contact both with micro- and nanostructures. A simple thermodynamic model was developed to explain static contact angle, hysteresis, and wetting transition on dual-roughness structures. | ko |
dc.description.statementofresponsibility | close | - |
dc.language | ENG | ko |
dc.publisher | ACADEMIC PRESS INC ELSEVIER SCIENCE | ko |
dc.subject | Dual roughness | ko |
dc.subject | Hierarchical structure | ko |
dc.subject | Lithography | ko |
dc.subject | Wettability | ko |
dc.title | Wettability of nanoengineered dual-roughness surfaces fabricated by UV-assisted capillary force lithography | ko |
dc.type | ARTICLE | ko |
dc.identifier.scopusid | 2-s2.0-69249202237 | ko |
dc.identifier.wosid | 000272262900025 | ko |
dc.type.rims | ART | ko |
dc.description.wostc | 45 | * |
dc.description.scopustc | 48 | * |
dc.date.tcdate | 2015-05-06 | * |
dc.date.scptcdate | 2014-10-17 | * |
dc.identifier.doi | 10.1016/j.jcis.2009.07.020 | ko |
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