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DC Field | Value | Language |
---|---|---|
dc.citation.endPage | 692 | - |
dc.citation.number | 6 | - |
dc.citation.startPage | 685 | - |
dc.citation.title | JOURNAL OF MECHANICAL SCIENCE AND TECHNOLOGY | - |
dc.citation.volume | 15 | - |
dc.contributor.author | Shin, Heungjoo | - |
dc.contributor.author | Cho, MR | - |
dc.contributor.author | Han, DC | - |
dc.date.accessioned | 2023-12-22T11:44:05Z | - |
dc.date.available | 2023-12-22T11:44:05Z | - |
dc.date.created | 2014-10-15 | - |
dc.date.issued | 2001-06 | - |
dc.description.abstract | Bitmap assisted focused-ion-beam (FIB) milling for the fabrication of combined atomic force scanning electrochemical microscopy (AFM-SECM) probes is presented. This technique facilitates the integration of frame-shaped nanoelectrodes recessed from the AFM tip. Thereby, the fabrication process for bifunctional AFM-SECM tips is significantly simplified while maintaining high reproducibility with reduced FIB milling time/cost. Additionally, different electrode geometries (frame- and disk-shaped) and a wide variety of ratios between electrode size and re-shaped AFM tip length can be easily maintained. Disk nanoelectrodes can be integrated with radii down to 50 nm after appropriate pre-modification of the AFM tip. Characterization and performance of bifunctional probes are demonstrated by using cyclic voltammetry at the tip-integrated electrodes and simultaneous imaging in contact mode AFM and feedback-mode SECM operation. Atomic force microscopy, AFM, Scanning electrochemical microscopy, SECM,. | - |
dc.identifier.bibliographicCitation | JOURNAL OF MECHANICAL SCIENCE AND TECHNOLOGY, v.15, no.6, pp.685 - 692 | - |
dc.identifier.issn | 1738-494X | - |
dc.identifier.scopusid | 2-s2.0-0035374289 | - |
dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/7294 | - |
dc.identifier.url | http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=34948894469 | - |
dc.identifier.wosid | 000169180300001 | - |
dc.language | 영어 | - |
dc.publisher | KOREAN SOC MECHANICAL ENGINEERS | - |
dc.title | Mixed lubrication analysis of cam/tappet interface on the direct acting type valvetrain system | - |
dc.type | Article | - |
dc.description.isOpenAccess | FALSE | - |
dc.description.journalRegisteredClass | scie | - |
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