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신흥주

Shin, Heungjoo
Micro/Nano Integrated Systems Lab.
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dc.citation.endPage 692 -
dc.citation.number 6 -
dc.citation.startPage 685 -
dc.citation.title JOURNAL OF MECHANICAL SCIENCE AND TECHNOLOGY -
dc.citation.volume 15 -
dc.contributor.author Shin, Heungjoo -
dc.contributor.author Cho, MR -
dc.contributor.author Han, DC -
dc.date.accessioned 2023-12-22T11:44:05Z -
dc.date.available 2023-12-22T11:44:05Z -
dc.date.created 2014-10-15 -
dc.date.issued 2001-06 -
dc.description.abstract Bitmap assisted focused-ion-beam (FIB) milling for the fabrication of combined atomic force scanning electrochemical microscopy (AFM-SECM) probes is presented. This technique facilitates the integration of frame-shaped nanoelectrodes recessed from the AFM tip. Thereby, the fabrication process for bifunctional AFM-SECM tips is significantly simplified while maintaining high reproducibility with reduced FIB milling time/cost. Additionally, different electrode geometries (frame- and disk-shaped) and a wide variety of ratios between electrode size and re-shaped AFM tip length can be easily maintained. Disk nanoelectrodes can be integrated with radii down to 50 nm after appropriate pre-modification of the AFM tip. Characterization and performance of bifunctional probes are demonstrated by using cyclic voltammetry at the tip-integrated electrodes and simultaneous imaging in contact mode AFM and feedback-mode SECM operation. Atomic force microscopy, AFM, Scanning electrochemical microscopy, SECM,. -
dc.identifier.bibliographicCitation JOURNAL OF MECHANICAL SCIENCE AND TECHNOLOGY, v.15, no.6, pp.685 - 692 -
dc.identifier.issn 1738-494X -
dc.identifier.scopusid 2-s2.0-0035374289 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/7294 -
dc.identifier.url http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=34948894469 -
dc.identifier.wosid 000169180300001 -
dc.language 영어 -
dc.publisher KOREAN SOC MECHANICAL ENGINEERS -
dc.title Mixed lubrication analysis of cam/tappet interface on the direct acting type valvetrain system -
dc.type Article -
dc.description.isOpenAccess FALSE -
dc.description.journalRegisteredClass scie -

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