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Shin, Heungjoo
Micro/Nano Integrated Systems (MNIS) Lab
Research Interests
  • Carbon-MEMS
  • Nanofabrication
  • Gas sensors
  • Biosensors
  • Electrochemical sensors
  • SPM


Mixed lubrication analysis of cam/tappet interface on the direct acting type valvetrain system

DC Field Value Language Shin, Heungjoo ko Cho, MR ko Han, DC ko 2014-10-16T01:55:26Z - 2014-10-15 ko 2001-06 ko
dc.identifier.citation JOURNAL OF MECHANICAL SCIENCE AND TECHNOLOGY, v.15, no.6, pp.685 - 692 ko
dc.identifier.issn 1738-494X ko
dc.identifier.uri -
dc.description.abstract Bitmap assisted focused-ion-beam (FIB) milling for the fabrication of combined atomic force scanning electrochemical microscopy (AFM-SECM) probes is presented. This technique facilitates the integration of frame-shaped nanoelectrodes recessed from the AFM tip. Thereby, the fabrication process for bifunctional AFM-SECM tips is significantly simplified while maintaining high reproducibility with reduced FIB milling time/cost. Additionally, different electrode geometries (frame- and disk-shaped) and a wide variety of ratios between electrode size and re-shaped AFM tip length can be easily maintained. Disk nanoelectrodes can be integrated with radii down to 50 nm after appropriate pre-modification of the AFM tip. Characterization and performance of bifunctional probes are demonstrated by using cyclic voltammetry at the tip-integrated electrodes and simultaneous imaging in contact mode AFM and feedback-mode SECM operation. Atomic force microscopy, AFM, Scanning electrochemical microscopy, SECM,. ko
dc.description.statementofresponsibility open -
dc.language 영어 ko
dc.title Mixed lubrication analysis of cam/tappet interface on the direct acting type valvetrain system ko
dc.type ARTICLE ko
dc.identifier.scopusid 2-s2.0-0035374289 ko
dc.identifier.wosid 000169180300001 ko
dc.type.rims ART ko
dc.description.wostc 0 *
dc.description.scopustc 3 * 2015-05-06 * 2014-10-15 *
dc.identifier.url ko
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