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Shin, Heungjoo
Micro/Nano Integrated Systems (MNIS) Lab
Research Interests
  • Carbon-MEMS
  • Nanofabrication
  • Gas sensors
  • Biosensors
  • Electrochemical sensors
  • SPM

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Mixed lubrication analysis of cam/tappet interface on the direct acting type valvetrain system

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Title
Mixed lubrication analysis of cam/tappet interface on the direct acting type valvetrain system
Author
Shin, HeungjooCho, MRHan, DC
Issue Date
2001-06
Publisher
KOREAN SOC MECHANICAL ENGINEERS
Citation
JOURNAL OF MECHANICAL SCIENCE AND TECHNOLOGY, v.15, no.6, pp.685 - 692
Abstract
Bitmap assisted focused-ion-beam (FIB) milling for the fabrication of combined atomic force scanning electrochemical microscopy (AFM-SECM) probes is presented. This technique facilitates the integration of frame-shaped nanoelectrodes recessed from the AFM tip. Thereby, the fabrication process for bifunctional AFM-SECM tips is significantly simplified while maintaining high reproducibility with reduced FIB milling time/cost. Additionally, different electrode geometries (frame- and disk-shaped) and a wide variety of ratios between electrode size and re-shaped AFM tip length can be easily maintained. Disk nanoelectrodes can be integrated with radii down to 50 nm after appropriate pre-modification of the AFM tip. Characterization and performance of bifunctional probes are demonstrated by using cyclic voltammetry at the tip-integrated electrodes and simultaneous imaging in contact mode AFM and feedback-mode SECM operation. Atomic force microscopy, AFM, Scanning electrochemical microscopy, SECM,.
URI
https://scholarworks.unist.ac.kr/handle/201301/7294
URL
http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=34948894469
ISSN
1738-494X
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