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Measurement and Analysis of IC Jitters and Soft Failures due to System-level ESD

Author(s)
Jeong, Myeongjo
Advisor
Kim, Jingook
Issued Date
2019-08
URI
https://scholarworks.unist.ac.kr/handle/201301/72802 http://unist.dcollection.net/common/orgView/200000223582
Publisher
Ulsan National Institute of Science and Technology (UNIST)
Degree
Master
Major
Graduate School of UNIST Department of Electrical Engineering

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