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Measurement and Analysis of IC Jitters and Soft Failures due to System-level ESD
- Author(s)
- Jeong, Myeongjo
- Advisor
- Kim, Jingook
- Issued Date
- 2019-08
- URI
- https://scholarworks.unist.ac.kr/handle/201301/72802 http://unist.dcollection.net/common/orgView/200000223582
- Publisher
- Ulsan National Institute of Science and Technology (UNIST)
- Degree
- Master
- Major
- Graduate School of UNIST Department of Electrical Engineering
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