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DC Field | Value | Language |
---|---|---|
dc.citation.endPage | 924 | - |
dc.citation.number | 3 | - |
dc.citation.startPage | 920 | - |
dc.citation.title | JOURNAL OF THE KOREAN PHYSICAL SOCIETY | - |
dc.citation.volume | 51 | - |
dc.contributor.author | Moon, Jong-Seok | - |
dc.contributor.author | Shin, Heungjoo | - |
dc.contributor.author | Mizaikoff, Boris | - |
dc.contributor.author | Kranz, Christine | - |
dc.date.accessioned | 2023-12-22T09:10:43Z | - |
dc.date.available | 2023-12-22T09:10:43Z | - |
dc.date.created | 2014-10-15 | - |
dc.date.issued | 2007-09 | - |
dc.description.abstract | Bitmap assisted focused-ion-beam (FIB) milling for the fabrication of combined atomic force scanning electrochemical microscopy (AFM-SECM) probes is presented. This technique facilitates the integration of frame-shaped nanoelectrodes recessed from the AFM tip. Thereby, the fabrication process for bifunctional AFM-SECM tips is significantly simplified while maintaining high reproducibility with reduced FIB milling time/cost. Additionally, different electrode geometries (frame- and disk-shaped) and a wide variety of ratios between electrode size and re-shaped AFM tip length can be easily maintained. Disk nanoelectrodes can be integrated with radii down to 50 nm after appropriate pre-modification of the AFM tip. Characterization and performance of bifunctional probes are demonstrated by using cyclic voltammetry at the tip-integrated electrodes and simultaneous imaging in contact mode AFM and feedback-mode SECM operation. Atomic force microscopy, AFM, Scanning electrochemical microscopy, SECM,. | - |
dc.identifier.bibliographicCitation | JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.51, no.3, pp.920 - 924 | - |
dc.identifier.issn | 0374-4884 | - |
dc.identifier.scopusid | 2-s2.0-34948894469 | - |
dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/7253 | - |
dc.identifier.wosid | 000249505200004 | - |
dc.language | 영어 | - |
dc.publisher | KOREAN PHYSICAL SOC | - |
dc.title | Bitmap-assisted focused ion beam fabrication of combined atomic force scanning electrochemical Microscopy probes | - |
dc.type | Article | - |
dc.description.journalRegisteredClass | scopus | - |
dc.subject.keywordAuthor | atomic force microscopy | - |
dc.subject.keywordAuthor | AFM | - |
dc.subject.keywordAuthor | scanning electrochemical microscopy | - |
dc.subject.keywordAuthor | SECM | - |
dc.subject.keywordAuthor | focused ion beam | - |
dc.subject.keywordAuthor | nanoelectrodes | - |
dc.subject.keywordAuthor | bifunctional scanning probes | - |
dc.subject.keywordPlus | CANTILEVER | - |
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