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Development of an On-chip Health Monitoring System for Solder Joints using Bit Error Rates
- Author(s)
- Shin, Insun
- Advisor
- Kwon, Daeil
- Issued Date
- 2018-02
- URI
- https://scholarworks.unist.ac.kr/handle/201301/72300 http://unist.dcollection.net/common/orgView/200000011549
- Publisher
- Ulsan National Institute of Science and Technology (UNIST)
- Degree
- Master
- Major
- Graduate School of UNIST Department of System Design and Control Engineering
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