dc.citation.endPage |
795 |
- |
dc.citation.number |
5 |
- |
dc.citation.startPage |
791 |
- |
dc.citation.title |
ADVANCED MATERIALS |
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dc.citation.volume |
26 |
- |
dc.contributor.author |
Kim, So Youn |
- |
dc.contributor.author |
Gwyther, Jessica |
- |
dc.contributor.author |
Manners, Ian |
- |
dc.contributor.author |
Chaikin, Paul M. |
- |
dc.contributor.author |
Register, Richard A. |
- |
dc.date.accessioned |
2023-12-22T03:06:48Z |
- |
dc.date.available |
2023-12-22T03:06:48Z |
- |
dc.date.created |
2014-10-15 |
- |
dc.date.issued |
2014-02 |
- |
dc.description.abstract |
Highly selective etch masks are formed by thin films of a polystyrene-b-poly(ferrocenylisopropylmethylsilane)diblock copolymer, PS-PFiPMS, containing hemicylindrical domains of PFiPMS. These domains, with a period of 35 nm, are readily aligned through mechanical shear. Aligned PS-PFiPMS templates are employed to fabricate high-aspect-ratio nanowire grids from amorphous silicon, which can polarize deep ultraviolet radiation, including 193 nm, at >90% efficiency. |
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dc.identifier.bibliographicCitation |
ADVANCED MATERIALS, v.26, no.5, pp.791 - 795 |
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dc.identifier.doi |
10.1002/adma.201303452 |
- |
dc.identifier.issn |
0935-9648 |
- |
dc.identifier.scopusid |
2-s2.0-84895060800 |
- |
dc.identifier.uri |
https://scholarworks.unist.ac.kr/handle/201301/7213 |
- |
dc.identifier.wosid |
000336043500019 |
- |
dc.language |
영어 |
- |
dc.publisher |
WILEY-V C H VERLAG GMBH |
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dc.title |
Metal-Containing Block Copolymer Thin Films Yield Wire Grid Polarizers with High Aspect Ratio |
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dc.type |
Article |
- |
dc.description.journalRegisteredClass |
scie |
- |
dc.description.journalRegisteredClass |
scopus |
- |