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- Kim, Jae Joon
- Circuits & Systems Design Lab.
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.assignee | 울산과학기술원 | - |
| dc.contributor.author | 박찬샘 | - |
| dc.contributor.author | 김재준 | - |
| dc.date.accessioned | 2024-01-23T18:37:14Z | - |
| dc.date.application | 2019-04-22 | - |
| dc.date.available | 2024-01-23T18:37:14Z | - |
| dc.date.registration | 2021-01-12 | - |
| dc.identifier.patentApplicationNumber | 16/390,344 | - |
| dc.identifier.patentRegistrationNumber | 10890633 | - |
| dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/69973 | - |
| dc.title | MIT 기술 응용을 위한 위상영역 검출장치 및 방법 | - |
| dc.type | Patent | - |
| dc.publisher.country | US | - |
| dc.type.iprs | 특허 | - |
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