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고현협

Ko, Hyunhyub
Functional Nanomaterials & Devices Lab.
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dc.contributor.assignee 울산과학기술원 / 부경대학교 산학협력단 / KCC -
dc.contributor.author 고현협 -
dc.contributor.author 김민수 -
dc.contributor.author 임금석 -
dc.contributor.author 김맹기 -
dc.contributor.author 전제홍 -
dc.contributor.author 형우찬 -
dc.contributor.author 신안섭 -
dc.date.accessioned 2024-01-23T17:06:53Z -
dc.date.application 2021-12-07 -
dc.date.available 2024-01-23T17:06:53Z -
dc.date.registration 2023-08-09 -
dc.identifier.patentApplicationNumber 10-2021-0173751 -
dc.identifier.patentRegistrationNumber 10-2566606 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/68346 -
dc.title 표면-계면 절단 분석시스템 기반 고분자 소재 분석 방법 -
dc.type Patent -
dc.publisher.country KO -
dc.type.iprs 특허 -

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