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DC Field | Value | Language |
---|---|---|
dc.citation.endPage | 13987 | - |
dc.citation.number | 11 | - |
dc.citation.startPage | 13977 | - |
dc.citation.title | IEEE TRANSACTIONS ON POWER ELECTRONICS | - |
dc.citation.volume | 38 | - |
dc.contributor.author | Jeong, Sangyeong | - |
dc.contributor.author | Kim, Jingook | - |
dc.date.accessioned | 2023-12-27T14:35:10Z | - |
dc.date.available | 2023-12-27T14:35:10Z | - |
dc.date.created | 2023-12-27 | - |
dc.date.issued | 2023-11 | - |
dc.description.abstract | This article presents an active electromagnetic interference (EMI) filter (AEF) implemented by one chip, including an EMI management-integrated circuit (EMIC) and power-management-integrated circuit (PMIC). The designed IC was fabricated by a 0.18 μm Biplor-CMOS-DMOS (BCD) process. By virtue of a designed buck converter implemented PMIC within the IC area, the integrated EMIC with PMIC can operate with a 15 to 45 V dc supply as well as a 12 V dc supply to operate EMI noise compensation. Through experimental validation using a real three-phase inverter motor system, the noise attenuation performance of the AEF was found to excel beyond that of a two-stage L-C passive EMI filter, achieving approximately 6 dB improvement at 150 kHz, while exhibiting no resonance peaks above 1 MHz. Further, the AEF effectively maintains the conducted emissions (CE) noise levels below the established CE regulations throughout the entire frequency range. The single-chip design integrates a malfunction detection mechanism that automatically shuts down the dc power supply in the event of an EMIC failure, thus ensuring enhanced safety and practicality. | - |
dc.identifier.bibliographicCitation | IEEE TRANSACTIONS ON POWER ELECTRONICS, v.38, no.11, pp.13977 - 13987 | - |
dc.identifier.doi | 10.1109/TPEL.2023.3305488 | - |
dc.identifier.issn | 0885-8993 | - |
dc.identifier.scopusid | 2-s2.0-85168265228 | - |
dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/67156 | - |
dc.identifier.wosid | 001105213800063 | - |
dc.language | 영어 | - |
dc.publisher | Institute of Electrical and Electronics Engineers | - |
dc.title | One-Chip Active EMI Filter With Integrated Buck Converter and Self-Malfunction Detection for CE Noise Reduction | - |
dc.type | Article | - |
dc.description.isOpenAccess | FALSE | - |
dc.relation.journalWebOfScienceCategory | Engineering | - |
dc.relation.journalResearchArea | Engineering, Electrical & Electronic | - |
dc.type.docType | Article | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.subject.keywordAuthor | Conducted emission (CE) | - |
dc.subject.keywordAuthor | electromagnetic interference (EMI) filter | - |
dc.subject.keywordAuthor | EMI management IC (EMIC) | - |
dc.subject.keywordAuthor | integrated circuit (IC) | - |
dc.subject.keywordAuthor | power-management IC (PMIC) | - |
dc.subject.keywordPlus | CIRCUIT | - |
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