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Kwon, Soon-Yong
Frontier, Innovative Nanomaterials & Devices Lab.
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dc.citation.endPage 5672 -
dc.citation.number 7B -
dc.citation.startPage 5670 -
dc.citation.title JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS -
dc.citation.volume 44 -
dc.contributor.author Kim, EK -
dc.contributor.author Kim, JS -
dc.contributor.author Kwon, Soon-Yong -
dc.contributor.author Kim, HJ -
dc.contributor.author Yoon, E -
dc.date.accessioned 2023-12-22T10:36:09Z -
dc.date.available 2023-12-22T10:36:09Z -
dc.date.created 2014-09-24 -
dc.date.issued 2005-07 -
dc.description.abstract The use of deep level transient spectroscopy (DLTS) for the analysis of energy band of InGaN/GaN self assembled quantum dots (QDs) was described. The QDs were grown on Al2O3 substrates by self-assembled method using metal-organic chemical vapor deposition system. The density of the QDs was found to be 7.0 × 109 cm-2, which was confirmed by atomic force microscope measurement. From the Arrhenius plot, the apparent activation energy and the emission cross section by the carrier emission process of QD-related levels were extracted 0.37 eV from the conduction band edge and 1.13 × 10-16 cm2, respectively. -
dc.identifier.bibliographicCitation JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, v.44, no.7B, pp.5670 - 5672 -
dc.identifier.doi 10.1143/JJAP.44.5670 -
dc.identifier.issn 0021-4922 -
dc.identifier.scopusid 2-s2.0-23244464985 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/6537 -
dc.identifier.url http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=23244464985 -
dc.identifier.wosid 000232029300079 -
dc.language 영어 -
dc.publisher JAPAN SOC APPLIED PHYSICS -
dc.title Study on energy band of InGaN/GaN self-assembled quantum dots by deep level transient spectroscopy -
dc.type Article -
dc.description.journalRegisteredClass scopus -

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