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Park, Saerom
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dc.citation.endPage 197 -
dc.citation.startPage 185 -
dc.citation.title PATTERN RECOGNITION -
dc.citation.volume 74 -
dc.contributor.author Son, Youngdoo -
dc.contributor.author Lee, Sujee -
dc.contributor.author Park, Saerom -
dc.contributor.author Lee, Jaewook -
dc.date.accessioned 2023-12-21T21:08:43Z -
dc.date.available 2023-12-21T21:08:43Z -
dc.date.created 2023-05-30 -
dc.date.issued 2018-02 -
dc.description.abstract An exemplar is an observation that represents a group of similar observations. Exemplars from data are examined to divide entire heterogeneous data into several homogeneous subgroups, wherein each subgroup is represented by an exemplar. With its inherent sparsity, an exemplar-based learning model provides a parsimonious model to represent or cluster large-scale data. A novel exemplar learning method using one-class Gaussian process (GP) regression is proposed in this study. The proposed method constructs data distribution support from one-class GP regression using automatic relevance determination prior and heterogeneous GP noise. Exemplars that correspond to the basis vectors of the constructed support function are then automatically located during the training process. The proposed method is applied to various data sets to examine its operability, characteristics of data representation, and cluster analysis. The exemplars of some real data generated by the proposed method are also reported. (C) 2017 Elsevier Ltd. All rights reserved. -
dc.identifier.bibliographicCitation PATTERN RECOGNITION, v.74, pp.185 - 197 -
dc.identifier.doi 10.1016/j.patcog.2017.09.002 -
dc.identifier.issn 0031-3203 -
dc.identifier.scopusid 2-s2.0-85032294108 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/64382 -
dc.identifier.wosid 000417547800015 -
dc.language 영어 -
dc.publisher ELSEVIER SCI LTD -
dc.title Learning representative exemplars using one-class Gaussian process regression -
dc.type Article -
dc.description.isOpenAccess FALSE -
dc.relation.journalWebOfScienceCategory Computer Science, Artificial Intelligence; Engineering, Electrical & Electronic -
dc.relation.journalResearchArea Computer Science; Engineering -
dc.type.docType Article -
dc.description.journalRegisteredClass scie -
dc.description.journalRegisteredClass scopus -
dc.subject.keywordAuthor Representative exemplars -
dc.subject.keywordAuthor One class Gaussian process regression -
dc.subject.keywordAuthor Support-based clustering -
dc.subject.keywordAuthor Automatic relevance determination -
dc.subject.keywordAuthor Kernel methods -
dc.subject.keywordPlus AFFINITY PROPAGATION -
dc.subject.keywordPlus K-MEDOIDS -
dc.subject.keywordPlus SUPPORT -

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