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DC Field | Value | Language |
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dc.citation.endPage | 1132 | - |
dc.citation.number | 3 | - |
dc.citation.startPage | 1121 | - |
dc.citation.title | IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS | - |
dc.citation.volume | 70 | - |
dc.contributor.author | Park, Kyeongmin | - |
dc.contributor.author | Oh, Seunghun | - |
dc.contributor.author | Choi, Dongjin | - |
dc.contributor.author | Shin, Kyeonghan | - |
dc.contributor.author | Cho, Haewan | - |
dc.contributor.author | Bien, Franklin | - |
dc.date.accessioned | 2023-12-21T12:49:34Z | - |
dc.date.available | 2023-12-21T12:49:34Z | - |
dc.date.created | 2023-02-14 | - |
dc.date.issued | 2023-03 | - |
dc.description.abstract | paper presents an external compensation system for QHD+ (3040 x 1224) mobile active-matrix organic light emitting diode (AMOLED) displays at a frame rate of 60 Hz. During vertical blank periods, current sensing AFE (CS-AFE) measures OLED currents to calculate threshold voltage (VT H) of driving thin-film transistors (TFTs). For precise VT H calculation against panel ground noise, a differential sensing scheme with 5-bit programmable capacitor array (PCA) is employed. In addition, digital correlated double sampling (CDS) removes an offset of the CS-AFE. However, recent advances in high efficiency OLED technology have led to increase in pixel density as well as the driving TFTs to operate close to subthreshold region. Therefore, the V-TH calculation based on the quadratic model yields inaccurate results. To compensate for the modeling error, we propose an error correction algorithm, which establishes an error function using a relationship between the modeling error and calculated threshold voltage during the manufacturing process. The proposed external compensation system was verified using CMOS-modeled three transistors and one capacitor (3T1C) pixel circuit. The test chip, fabricated in a 0.18 mu m BCD process, comprises 26 channels. Each channel consumes 78 mu W and occupies 1350 x 50 mu m(2). Measurement results show that current error at 64th gray level is reduced from 35.56 LSB to 6.03 LSB after error correction and four frames average. | - |
dc.identifier.bibliographicCitation | IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, v.70, no.3, pp.1121 - 1132 | - |
dc.identifier.doi | 10.1109/TCSI.2022.3223975 | - |
dc.identifier.issn | 1549-8328 | - |
dc.identifier.scopusid | 2-s2.0-85144072304 | - |
dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/61975 | - |
dc.identifier.wosid | 000912793200001 | - |
dc.language | 영어 | - |
dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | - |
dc.title | Real-Time External Compensation System With Error Correction Algorithm for High-Resolution Mobile Displays | - |
dc.type | Article | - |
dc.description.isOpenAccess | FALSE | - |
dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic | - |
dc.relation.journalResearchArea | Engineering | - |
dc.type.docType | Article; Early Access | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.subject.keywordAuthor | Active matrix organic light-emitting diode (AMOLED) | - |
dc.subject.keywordAuthor | high-resolution and high frame rate displays | - |
dc.subject.keywordAuthor | external compensation | - |
dc.subject.keywordAuthor | column driver | - |
dc.subject.keywordAuthor | current sensing AFE | - |
dc.subject.keywordAuthor | error correction algorithm | - |
dc.subject.keywordAuthor | thin-film transistor (TFT) | - |
dc.subject.keywordAuthor | bias stress instability | - |
dc.subject.keywordPlus | THRESHOLD VOLTAGE | - |
dc.subject.keywordPlus | COLUMN DRIVER | - |
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