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Bien, Franklin
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dc.citation.endPage 1132 -
dc.citation.number 3 -
dc.citation.startPage 1121 -
dc.citation.title IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS -
dc.citation.volume 70 -
dc.contributor.author Park, Kyeongmin -
dc.contributor.author Oh, Seunghun -
dc.contributor.author Choi, Dongjin -
dc.contributor.author Shin, Kyeonghan -
dc.contributor.author Cho, Haewan -
dc.contributor.author Bien, Franklin -
dc.date.accessioned 2023-12-21T12:49:34Z -
dc.date.available 2023-12-21T12:49:34Z -
dc.date.created 2023-02-14 -
dc.date.issued 2023-03 -
dc.description.abstract paper presents an external compensation system for QHD+ (3040 x 1224) mobile active-matrix organic light emitting diode (AMOLED) displays at a frame rate of 60 Hz. During vertical blank periods, current sensing AFE (CS-AFE) measures OLED currents to calculate threshold voltage (VT H) of driving thin-film transistors (TFTs). For precise VT H calculation against panel ground noise, a differential sensing scheme with 5-bit programmable capacitor array (PCA) is employed. In addition, digital correlated double sampling (CDS) removes an offset of the CS-AFE. However, recent advances in high efficiency OLED technology have led to increase in pixel density as well as the driving TFTs to operate close to subthreshold region. Therefore, the V-TH calculation based on the quadratic model yields inaccurate results. To compensate for the modeling error, we propose an error correction algorithm, which establishes an error function using a relationship between the modeling error and calculated threshold voltage during the manufacturing process. The proposed external compensation system was verified using CMOS-modeled three transistors and one capacitor (3T1C) pixel circuit. The test chip, fabricated in a 0.18 mu m BCD process, comprises 26 channels. Each channel consumes 78 mu W and occupies 1350 x 50 mu m(2). Measurement results show that current error at 64th gray level is reduced from 35.56 LSB to 6.03 LSB after error correction and four frames average. -
dc.identifier.bibliographicCitation IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, v.70, no.3, pp.1121 - 1132 -
dc.identifier.doi 10.1109/TCSI.2022.3223975 -
dc.identifier.issn 1549-8328 -
dc.identifier.scopusid 2-s2.0-85144072304 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/61975 -
dc.identifier.wosid 000912793200001 -
dc.language 영어 -
dc.publisher IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC -
dc.title Real-Time External Compensation System With Error Correction Algorithm for High-Resolution Mobile Displays -
dc.type Article -
dc.description.isOpenAccess FALSE -
dc.relation.journalWebOfScienceCategory Engineering, Electrical & Electronic -
dc.relation.journalResearchArea Engineering -
dc.type.docType Article; Early Access -
dc.description.journalRegisteredClass scie -
dc.description.journalRegisteredClass scopus -
dc.subject.keywordAuthor Active matrix organic light-emitting diode (AMOLED) -
dc.subject.keywordAuthor high-resolution and high frame rate displays -
dc.subject.keywordAuthor external compensation -
dc.subject.keywordAuthor column driver -
dc.subject.keywordAuthor current sensing AFE -
dc.subject.keywordAuthor error correction algorithm -
dc.subject.keywordAuthor thin-film transistor (TFT) -
dc.subject.keywordAuthor bias stress instability -
dc.subject.keywordPlus THRESHOLD VOLTAGE -
dc.subject.keywordPlus COLUMN DRIVER -

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